Persistent structural distortions and absent superconductivity in trilayer nickelate thin films
This study systematically investigates the strain effect in trilayer nickelate La₄Ni₃O₁₀ thin films through atomically precise synthesis, electrical transport measurements, picometer-resolution electron microscopy, and synchrotron X-ray diffraction. While compressive epitaxial strain effectively suppresses the parent density-wave order and enhances crystal symmetry (e.g., eliminating out-of-plane octahedral rotations), no superconductivity is observed even under the maximum compressive strain of -2.8%. Critical structural characterization reveals that compressive strain fails to completely eliminate the characteristic in-plane octahedral rotations in the thin films, which exhibit interlayer inequivalence between the inner and outer layers of each trilayer unit and persist robustly. Synchrotron X-ray diffraction shows that the amplitude of in-plane rotations decreases monotonically with compressive strain but does not vanish entirely. In contrast, in the bilayer system La₃Ni₂O₇, compressive strain fully suppresses all octahedral rotations, thereby inducing superconductivity. These results uncover a key difference between trilayer and bilayer systems, indicating that ambient-pressure superconductivity in trilayer nickelates cannot be achieved solely through epitaxial strain engineering, and alternative tuning methods need to be explored.